Generating Tests by Exploiting Designed Behavior

Mark Harper Shirley

One of the hardest problems in digital circuit design is test pattern generation for a complex device. This is difficult in part because it requires reasoning about how to control a device whose behavior can be extremely complex. Knowledge of the specific operations that the device was designed to perform can help solve this problem. The key observation is that a device’s designed behavior is often far more limited than the device’s potential behavior. This limitation translates into a reduction of the search necessary to achieve planning goals. We describe an implemented program based on this idea.

This page is copyrighted by AAAI. All rights reserved. Your use of this site constitutes acceptance of all of AAAI's terms and conditions and privacy policy.